Last edited by Malall
Tuesday, May 12, 2020 | History

2 edition of Functional test generation of digital LSI/VLSI systems using machine symbolic execution technique found in the catalog.

Functional test generation of digital LSI/VLSI systems using machine symbolic execution technique

Tonysheng Lin

Functional test generation of digital LSI/VLSI systems using machine symbolic execution technique

by Tonysheng Lin

  • 106 Want to read
  • 19 Currently reading

Published .
Written in English

    Subjects:
  • Integrated circuits -- Large scale integration.,
  • Integrated circuits -- Very large scale integration.

  • Edition Notes

    Statementby Tonysheng Lin.
    SeriesPh. D. theses (State University of New York at Binghamton) -- no. 785
    The Physical Object
    Paginationxii, 309 leaves :
    Number of Pages309
    ID Numbers
    Open LibraryOL22124502M


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Functional test generation of digital LSI/VLSI systems using machine symbolic execution technique by Tonysheng Lin Download PDF EPUB FB2